Attributes | Values |
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type
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Author
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dc:subject
| - Physics
- Physique
- Crystallography
- Laser
- Cristallographie
- Rayons X -- Diffraction
- Surfaces (Physics)
- Crystallography and Scattering Methods
- Surfaces (technologie)
- Propriétés optiques
- Couches minces -- Propriétés optiques
- Spectrum analysis
- Thin films -- Optical properties
- Couches minces
- Langmuir-Blodgett, Couches de
- X-rays -- Diffraction
- Rayons X -- Diffusion
- X-rays -- Scattering
- Langmuir-Blodgett, Couches de -- Propriétés optiques
- Thin films, Multilayered -- Optical properties
- Surfaces, Interfaces and Thin Film
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preferred label
| - High resolution x-ray scattering from thin films and multilayers
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Language
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Subject
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dc:title
| - High resolution x-ray scattering from thin films and multilayers
|
note
| - This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
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dc:type
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http://iflastandar...bd/elements/P1001
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rdaw:P10219
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has content type
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is primary topic
of | |
is rdam:P30135
of | |