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AttributesValues
Author
Bibliographic Citation
  • Gorondy-Novak S., Jomard F., Prima F.. SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2017, 398, ⟨10.1016/j.nimb.2017.02.036⟩
Title
  • SIMS as a new methodology to depth profile helium in as-implanted and annealed pure bcc metals?
dc:date
  • 2017
Digital Object Identifier (DOI)
  • 10.1016/j.nimb.2017.02.036
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