AttributesValues
Author
Bibliographic Citation
  • Rouessac V., Puyrenier W., Van Der Lee A., Broussous L., Rebiscoul D., Durand J., Ayral A.. Oral : "Pore sealing of nanoporous hybrid thin films studied by ellipsometric porosimetry". 4th Workshop Ellipsometry, 2006, Berlin, Germany
Title
  • Oral : "Pore sealing of nanoporous hybrid thin films studied by ellipsometric porosimetry
dc:date
  • 2006
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