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Author	Schmittbuhl, Jean Gratier, Jean-Pierre (1948-.... ; géophysicien) Toussaint, Renaud
Bibliographic Citation	Schmittbuhl Jean, Renard Francois, Gratier Jean-Pierre, Toussaint Renaud. Roughness of stylolites: Implications of 3D high resolution topography measurements. Physical Review Letters, American Physical Society, 2005, 93 (23), pp.238501. ⟨10.1103/physrevlett.93.238501⟩ SchmittbuhlJean, RenardFrancois, GratierJean-Pierre, ToussaintRenaud . Roughness of stylolites: Implications of 3D high resolution topography measurements . Physical Review Letters, American Physical Society, 2005, 93 (23), pp.238501 . ⟨10.1103/physrevlett.93.238501⟩
dc:date	2005
Digital Object Identifier (DOI)	10.1103/physrevlett.93.238501

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