About: Hot carrier aging degradation phenomena in GaN based MESFETs   Goto Sponge  NotDistinct  Permalink

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  • Rampazzo F., Pierobon G., Pacetta D., Gaquiere C., Theron D., Boudart B., Meneghesso G., Zanoni E.. Hot carrier aging degradation phenomena in GaN based MESFETs. Microelectronics Reliability, Elsevier, 2004, 44, pp.1375-1380
Title
  • Hot carrier aging degradation phenomena in GaN based MESFETs
dc:date
  • 2004
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