About: Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers Goto Sponge NotDistinct Permalink

An Entity of Type : owl:Thing, within Data Space : data.idref.fr associated with source document(s)

Attributes	Values
Author	Mermoux, Michel (1961-.... ; auteur en génie des procédés) Auvray, Laurent (1970-....) Wellmann, Peter (19..-....) Pons, Michel (1954-.... ; chercheur en thermodynamique) Thuaire, Aurélie (1979-.... ; auteure en sciences des matériaux)
Bibliographic Citation	Wellmann Peter, Müller Ralf, Pons Michel, Thuaire Aurélie, Crisci Alexandre, Mermoux Michel, Auvray Laurent. Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers. Materials Science Forum, Trans Tech Publications Inc., 2005, 483?485, pp. 393-396. ⟨10.4028/0-87849-963-6.393⟩ WellmannPeter, MüllerRalf, PonsMichel, ThuaireAurélie, CrisciAlexandre, MermouxMichel, AuvrayLaurent . Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers . Materials Science Forum, Trans Tech Publications Inc., 2005, 483?485, pp . 393-396 . ⟨10.4028/0-87849-963-6.393⟩
Title	Micro-Optical Characterization Study of Highly p-Type Doped SiC:Al Wafers
dc:date	2005
Digital Object Identifier (DOI)	10.4028/0-87849-963-6.393

Faceted Search & Find service v1.13.91 as of Aug 16 2018

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3229 as of May 14 2019, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (70 GB total memory)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2025 OpenLink Software