Bibliographic Citation
| - Malbert Nathalie, Labat Nathalie, Curutchet Arnaud, Sury Charlotte, Hoel Virginie, De Jaeger Jean-Claude, Defrance Nicolas, Douvry Yannick, Dua Christian, Oualli Mourad, Bru-Chevallier Catherine, Bluet Jean-Marie, Chikhaoui Walf. Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs. GaN microwave component technology workshop, Mar 2009, Ulm, Germany
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