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Author	Malbert, Nathalie (1968-....) De Jaeger, Jean-Claude (19..-....) Curutchet, Arnaud (1975-....) Sury, Charlotte (1981-...) Labat, Nathalie (1962-.... ; professeure en électronique) Defrance, Nicolas (1982-....) Dua, Christian Hoel, Virginie (1972-....) Bluet, Jean-Marie Chikhaoui, Walf (1983-....) Douvry, Yannick (1985-....) Bru-Chevallier, Catherine (1956-....)
Bibliographic Citation	Malbert N., Labat N., Curutchet A., Sury C., Hoel V., De Jaeger J.C., Defrance N., Douvry Y., Dua C., Oualli M., Bru-Chevallier C., Bluet J.M., Chikhaoui W.. Characterisation and modelling of parasitic effects and failure mechanisms in AlGaN/GaN HEMTs. Microelectronics Reliability, Elsevier, 2009, 49, pp.1216-1221. ⟨10.1016/j.microrel.2009.07.015⟩
dc:date	2009

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