About: Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs

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About: Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs Goto Sponge NotDistinct Permalink

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Author	Malbert, Nathalie (1968-....) De Jaeger, Jean-Claude (19..-....) Curutchet, Arnaud (1975-....) Sury, Charlotte (1981-...) Labat, Nathalie (1962-.... ; professeure en électronique) Piazza, Michele (1981-....) Defrance, Nicolas (1982-....) Dua, Christian Hoel, Virginie (1972-....) Bluet, Jean-Marie Chikhaoui, Walf (1983-....) Douvry, Yannick (1985-....) Bru-Chevallier, Catherine (1956-....)
Bibliographic Citation	Malbert N., Labat N., Curutchet A., Sury C., Hoel V., De Jaeger J.C., Defrance N., Douvry Y., Dua C., Oualli M., Piazza M., Bru-Chevallier C., Bluet J.M., Chikhaoui W.. Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs. IEEE International Reliability Physics Symposium, IRPS 2010, 2010, United States. pp.139-145, ⟨10.1109/IRPS.2010.5488839⟩
Title	Reliability assessment in different HTO test conditions of AlGaN/GaN HEMTs
dc:date	2010

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