Bibliographic Citation
| - Douvry Y., Hoel V., De Jaeger J.C., Defrance N., Malbert N., Labat N., Curutchet A., Sury C., Dua C., Oualli M., Piazza M., Bluet J., Chikhaoui W., Bru-Chevallier C.. Temperature dependent degradation modes in AlGaN/GaN HEMTs. 5th European Microwave Integrated Circuits Conference, EuMIC 2010, 2010, France. pp.114-117
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