Bibliographic Citation
| - Clement N., Dargent T., Tanbakuchi H., Nishiguchi K., SIVAKUMARASAMY R., Wang F., Fujiwara A., Ducatteau D., Dambrine G., Vuillaume D., Legrand Bernard, Theron D.. Interferometric scanning microwave microscope for nanotechnology application. American Physical Society March Meeting, APS March Meeting 2013, 2013, Baltimore, MD, United States
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