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Author
Bibliographic Citation
  • Richardson Alexandre, Martoglio Laurent, Cirio Laurent, Picon Odile. 3D-FDTD characterization of an original low-loss silicon line. COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, 2002, 21 (4), pp.625 - 633. ⟨10.1108/03321640210437879⟩
Title
  • 3D-FDTD characterization of an original low-loss silicon line
dc:date
  • 2002
Digital Object Identifier (DOI)
  • 10.1108/03321640210437879
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