About: Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction   Goto Sponge  NotDistinct  Permalink

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Bibliographic Citation
  • Proietti M. G., Renevier Hubert, Favre-Nicolin V., Zhong Z., Chen G., Stoffel M., Renaud G., Schülli T. U.. Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction. The European Physical Journal. Special Topics, EDP Sciences, 2009, 167 (1), pp.3-10. ⟨10.1140/epjst/e2009-00929-4⟩
Title
  • Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction
dc:date
  • 2009
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