About: Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for III-V photonics platform on silicon

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About: Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for III-V photonics platform on silicon Goto Sponge NotDistinct Permalink

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Author	Cornet, Charles (1978-.... ; spécialiste en photonique) Wang, Yanping (1987-....) Ponchet, Anne (1962-.... ; auteure en physique) Bertru, Nicolas (19..-....) Stodolna, Julien (1983-....) Even, Jacky (19..-....) Letoublon, Antoine (1971-.... ; auteur en science des matériaux) Durand, Olivier (1977-....) Le Corre, Alain (19..-....)
Bibliographic Citation	Wang Yanping, Létoublon Antoine, Nguyen Thanh Tra, Stodolna Julien, Bertru Nicolas, Le Corre Alain, Ponchet Anne, Magen C., Boudet Nathalie, Micha Jean-Sébastien, Even Jacky, Cornet Charles, Durand Olivier. Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for III-V photonics platform on silicon. 12th Biennal Conference on High-Resolution X-Ray Diffraction and Imaging, Sep 2014, Villard de Lans, France
Title	Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for III-V photonics platform on silicon
dc:date	2014

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