About: Quantitative evaluation of microtwins and antiphase defects in GaP/Sinanolayers for a III–V photonics platform on siliconusing a laboratory Xray diffraction setup

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About: Quantitative evaluation of microtwins and antiphase defects in GaP/Sinanolayers for a III–V photonics platform on siliconusing a laboratory Xray diffraction setup Goto Sponge NotDistinct Permalink

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Author	Patriarche, Gilles (19..-....) Bahri, Mounib (1988-....) Cornet, Charles (1978-.... ; spécialiste en photonique) Wang, Yanping (1987-....) Bertru, Nicolas (19..-....) Letoublon, Antoine (1971-.... ; auteur en science des matériaux) Largeau, Ludovic (1974-....) Durand, Olivier (1977-....) Le Corre, Alain (19..-....)
Bibliographic Citation	Wang Yanping, Létoublon Antoine, Nguyen Thanh Tra, Bahri Mounib, Largeau Ludovic, Patriarche Gilles, Cornet Charles, Bertru Nicolas, Le Corre Alain, Durand Olivier. Quantitative evaluation of microtwins and antiphase defects in GaP/Sinanolayers for a III–V photonics platform on siliconusing a laboratory Xray diffraction setup. Journal of Applied Crystallography, International Union of Crystallography, 2015, 48 (3), pp.702-710. ⟨10.1107/S1600576715009954⟩
Title	Quantitative evaluation of microtwins and antiphase defects in GaP/Sinanolayers for a III–V photonics platform on siliconusing a laboratory Xray diffraction setup
dc:date	2015

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