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Author
Bibliographic Citation
  • Bernardini S., Masson P., Houssa M., Lalande F.. Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide. Applied Physics Letters, American Institute of Physics, 2004, 84 (21), pp.4251-4253. ⟨10.1063/1.1756681⟩
  • Bernardini S., Masson P., Houssa M., Lalande F.. Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide. Applied Physics Letters, 2004, 84 (21), pp.4251-4253. ⟨10.1063/1.1756681⟩
Title
  • Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
dc:date
  • 2004
Digital Object Identifier (DOI)
  • 10.1063/1.1756681
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