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  • Forero Freddy, Galliere Jean-Marc, Renovell Michel, Champac Víctor. Analysis of short defects in FinFET based logic cells. LATS: Latin American Test Symposium, Mar 2017, Bogota, Colombia. ⟨10.1109/LATW.2017.7906755⟩
Title
  • Analysis of short defects in FinFET based logic cells
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  • 2017
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