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  • Cuisinier Frédéric, Picart C., Ladam G., Senger B., Voegel C., Schaaf P., Gergely C.. Determination of structural parameters characterizing thin films by optical methods: A comparison between scanning angle reflectometry and optical waveguide lightmode spectroscopy. Journal of Chemical Physics, American Institute of Physics, 2001, 115 (2), pp.1086 - 1094. ⟨10.1063/1.1375156⟩
Title
  • Determination of structural parameters characterizing thin films by optical methods: A comparison between scanning angle reflectometry and optical waveguide lightmode spectroscopy
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  • 2001
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