Bibliographic Citation
| - Liang C-H, An Y-T, Jin W, Meng D-C, Wang W., Chen C-A, Liu K-Z, Kleyn W, Labbe C., Cardin Julien, Gourbilleau F.. Correlation between composition, microstructure, and emission properties in Nd-doped Si-rich Si oxynitride films: investigation into the nature of the sensitizer. Nanotechnology, Institute of Physics, 2019, 30 (4), pp.045702
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