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Bibliographic Citation
  • Dubois Christiane, Prudon Gilles, Dupuy Jean-Claude, Gautier Brice, Canut Bruno, Le Gall Yann, Kociniewski Thierry. The isotopic comparative method (ICM) for SIMS quantification of boron in silicon up to 40 at.%. Surface and Interface Analysis, Wiley-Blackwell, 2011, 43 (1-2), pp.36-40
  • Dubois Christiane, Prudon Gilles, Gautier Brice, Canut Bruno, Le Gall Yann, Kociniewski Thierry . The isotopic comparative method (ICM) for SIMS quantification of boron in silicon up to 40 at.% . Surface and Interface Analysis, 2011, 43 (1-2), pp.36-40
dc:date
  • 2011
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