Bibliographic Citation
| - Caillau Mathieu, Chevalier Céline, Cremillieu Pierre, Delair Thierry, Soppera Olivier, Leuschel Benjamin, Ray Cédric, Moulin Christophe, Jonin Christian, Benichou Emmanuel, Brevet Pierre-Francois, Yeromonahos Christelle, Laurenceau Emmanuelle, Chevolot Yann, Leclercq Jean-Louis . Sub-micron lines patterning into silica using water developable chitosan bioresist films for eco-friendly positive tone e-beam and UV lithography . SPIE Advanced Lithography, Feb 2018, San Jose, United States . pp.105870S, ⟨10.1117/12.2292312⟩
- Caillau Mathieu, Chevalier Céline, Cremillieu Pierre, Delair Thierry, Soppera Olivier, Leuschel Benjamin, Ray Cédric, Moulin Christophe, Jonin Christian, Benichou Emmanuel, Brevet Pierre-Francois, Yeromonahos Christelle, Laurenceau Emmanuelle, Chevolot Yann, Leclercq Jean-Louis. Sub-micron lines patterning into silica using water developable chitosan bioresist films for eco-friendly positive tone e-beam and UV lithography. SPIE Advanced Lithography, Feb 2018, San Jose, United States. pp.105870S, ⟨10.1117/12.2292312⟩
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