About: Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique

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Author	Baboux, Nicolas (1975-....) Gautier, Brice (19..-....) Martin, Simon (1988-...) Gruverman, Alexei (19..-....) GICH, Marti Carretero-Genevrier, Adrián (19..-....)
Bibliographic Citation	Martin Simon, Gautier Brice, BABOUX Nicolas, Gruverman Alexei, Carretero-Genevrier Adrian, Gich Marti, Gómez Andrés. Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique. Electrical Atomic Force Microscopy for Nanoelectronics, pp.173-203, 2019 Martin Simon, Gautier Brice, Baboux Nicolas, Carretero-Genevrier Adrian, Gich Marti, Gómez Andrés . Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique . Electrical Atomic Force Microscopy for Nanoelectronics, pp.173-203, 2019, ⟨10.1007/978-3-030-15612-1_6⟩
Title	Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
dc:date	2019
Digital Object Identifier (DOI)	10.1007/978-3-030-15612-1_6

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