Bibliographic Citation
| - Zhou Ang, Wang Yanping, Létoublon Antoine, Lucci Ida, Cornet Charles, Favre-Nicolin Vincent, Chahine Gilbert, Eymery Joel, Léger Yoan, Bahri Mouib, Largeau Ludovic, Patriarche Gilles, Pedesseau Laurent, Turban Pascal, Charbonnier Simon, Schulli Tobias, Durand Olivier. Nano Beam X-ray Scattering on GaP/Si for III-V Monolithic Integration on Silicon. European Materials Research Society - Spring Meeting 2018 (E-MRS 2018 Spring Meeting), Jun 2018, Strasbourg, France
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