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Author
Bibliographic Citation
  • Richard Marie‐Ingrid, Cornelius Thomas W., Lauraux Florian, Molin Jean‐Baptiste, Kirchlechner Christoph, Leake Steven, Carnis Jérôme, Schulli Tobias, Thilly Ludovic, Thomas Olivier. Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping. Small, Wiley-VCH Verlag, 2020, pp.1905990. ⟨10.1002/smll.201905990⟩
  • Richard Marie‐ingrid, Cornelius Thomas W., Lauraux Florian, Molin Jean‐baptiste, Kirchlechner Christoph, Leake Steven, Carnis Jérôme, Schulli Tobias, Thilly Ludovic, Thomas Olivier . Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping . Small, 2020, pp.1905990 . ⟨10.1002/smll.201905990⟩
  • Richard Marie‐ingrid, Cornelius Thomas W., Lauraux Florian, Molin Jean‐baptiste, Kirchlechner Christoph, Leake Steven, Carnis Jérôme, Schulli Tobias, Thilly Ludovic, Thomas Olivier. Variable‐Wavelength Quick Scanning Nanofocused X‐Ray Microscopy for In Situ Strain and Tilt Mapping. Small, 2020, pp.1905990. ⟨10.1002/smll.201905990⟩
dc:date
  • 2020
Digital Object Identifier (DOI)
  • 10.1002/smll.201905990
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