Bibliographic Citation
| - Serin V., Andrieu S., Serra R., Bonell Frédéric, Tiusan C., Calmels L., Varela M., Pennycook S., Snoeck E., Walls M., Colliex C.. TEM and EELS measurements of interface roughness in epitaxial Fe/MgO/Fe magnetic tunnel junctions. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2009, 79 (14), ⟨10.1103/PhysRevB.79.144413⟩
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