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  • Albany F., Curutchet A., Labat N., Lecourt F., Walasiak E., Maher H., Cordier Y., Defrance N., Malbert N.. An advanced ageing methodology for robustness assessment of normally-off AlGaN/GaN HEMT. 15th European Microwave Integrated Circuits Conference, EuMIC 2020, Jan 2021, Utrecht, Netherlands. 237-240, https://ieeexplore.ieee.org/abstract/document/9337362
Title
  • An advanced ageing methodology for robustness assessment of normally-off AlGaN/GaN HEMT
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  • 2021
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