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Author
Bibliographic Citation
  • Timm M., Oliviero E., Sun W., Gomès Séverine, Hamaoui Georges, Fichtner P., Frety N. . Ion implantation effects on the microstructure, electrical resistivity and thermal conductivity of amorphous CrSi2 thin films . Journal of Materials Science, 2022, 57 (2), pp.1174-1185 . ⟨10.1007/s10853-021-06674-8⟩
  • Timm M., Oliviero E., Sun W., Gomès Séverine, Hamaoui Georges, Fichtner P., Frety N.. Ion implantation effects on the microstructure, electrical resistivity and thermal conductivity of amorphous CrSi2 thin films. Journal of Materials Science, 2022, 57 (2), pp.1174-1185. ⟨10.1007/s10853-021-06674-8⟩
Title
  • Ion implantation effects on the microstructure, electrical resistivity and thermal conductivity of amorphous CrSi2 thin films
dc:date
  • 2022
Digital Object Identifier (DOI)
  • 10.1007/s10853-021-06674-8
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