About: (Invited) Characterization and Metrology of Nanoclusters-Based Nanostructures by Atom Probe Tomography

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Author	Gourbilleau, Fabrice (1965-....) Lardé, Rodrigue (1977-.... ; enseignant-chercheur en physique des matériaux) Pareige, Philippe (1966-.... ; enseignant-chercheur en physique des matériaux) Talbot, Etienne (1979-... ; enseignant-chercheur en physique des matériaux)
Bibliographic Citation	Pareige Philippe, Lardé Rodrigue, Gourbilleau F., Talbot Etienne . (Invited) Characterization and Metrology of Nanoclusters-Based Nanostructures by Atom Probe Tomography . ECS Meeting Abstracts, 2011, MA2011-01 (19), pp.1252-1252 . ⟨10.1149/MA2011-01/19/1252⟩
Title	(Invited) Characterization and Metrology of Nanoclusters-Based Nanostructures by Atom Probe Tomography
dc:date	2011
Digital Object Identifier (DOI)	10.1149/MA2011-01/19/1252

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