Bibliographic Citation
| - Béchu Solène, Loubat Anais, Bouttemy Muriel, Marot Yves, Blévin Thomas, Langlois Jonathan, Zauner Andy, Frégnaux Mathieu, Aureau Damien, Vigneron Jackie, Uhlig Peter, Pouliquen Sylvain, Etcheberry Arnaud . XPS profiling study of Al<inf>2</inf>O<inf>3</inf> passivation layers for high efficiency n-PERT and PERC solar cells . 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), IEEE, pp.3069-3072, 2018, ⟨10.1109/PVSC.2018.8547412⟩
- Béchu Solène, Loubat Anais, Bouttemy Muriel, Marot Yves, Blévin Thomas, Langlois Jonathan, Zauner Andy, Frégnaux Mathieu, Aureau Damien, Vigneron Jackie, Uhlig Peter, Pouliquen Sylvain, Etcheberry Arnaud. XPS profiling study of Al<inf>2</inf>O<inf>3</inf> passivation layers for high efficiency n-PERT and PERC solar cells. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC), IEEE, pp.3069-3072, 2018, ⟨10.1109/PVSC.2018.8547412⟩
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