Bibliographic Citation
| - Ray C., Bräuning-Demian A., Bräuning H., Chevallier M., Cohen C., Dauvergne D., L'Hoir A., Kozhuharov C., Liesen D., H. Mokler P., Poizat J.-C., Stöhlker Th., Testa E., Toulemonde M.. Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2011, 84, pp.024119. ⟨10.1103/PhysRevB.84.024119⟩
- RayC., ChevallierM., CohenC., DauvergneD., L'HoirA., PoizatJ.-C., TestaE. . Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals . Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 2011, 84, pp.024119 . ⟨10.1103/PhysRevB.84.024119⟩
- Ray C., Chevallier M., Cohen C., Dauvergne D., L'Hoir A., Poizat J.-C., Testa E. . Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals . Physical Review B: Condensed Matter and Materials Physics (1998-2015), 2011, 84, pp.024119 . ⟨10.1103/PhysRevB.84.024119⟩
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