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dcterms:bibliographicCitation
Bernardini S., Masson P., Houssa M., Lalande F.. Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide. Applied Physics Letters, American Institute of Physics, 2004, 84 (21), pp.4251-4253. ⟨10.1063/1.1756681⟩ Bernardini S., Masson P., Houssa M., Lalande F.. Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide. Applied Physics Letters, 2004, 84 (21), pp.4251-4253. ⟨10.1063/1.1756681⟩
dcterms:title
Origin and repartition of the oxide fixed charges generated by electrical stress in memory tunnel oxide
dc:date
2004
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10.1063/1.1756681