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dcterms:bibliographicCitation
Cantin J., Schoisswohl M., Von Bardeleben J., Hadj Zoubir N., Vergnat M.. Electron-paramagnetic-resonance study of the microscopic structure of the Si(001)- SiO 2 interface. Physical Review B: Condensed Matter and Materials Physics (1998-2015), American Physical Society, 1995, 52 (16), pp.R11599-R11602. ⟨10.1103/PhysRevB.52.R11599⟩
dcterms:title
Electron-paramagnetic-resonance study of the microscopic structure of the Si(001)- SiO 2 interface
dc:date
1995