"10.1109/S3S.2015.7333546" . . . "Full front and back split C-V characterization of CMOS devices from 14nm node FDSOI technology" . . "Mohamad B., Ghibaudo G., Leroux C., Josse E., Reimbold G.. Full front and back split C-V characterization of CMOS devices from 14nm node FDSOI technology. 2015 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S), Oct 2015, Rohnert Park, United States. pp.9a.4, ⟨10.1109/S3S.2015.7333546⟩" . . "2015" . . "Mohamad B., Ghibaudo G., Leroux C., Josse E., Reimbold G. . Full front and back split C-V characterization of C M O S devices from 14nm node F D S O I technology . 2015 I E E E S O I-3 D-Subthreshold Microelectronics Technology Unified Conference ( S3 S), Oct 2015, Rohnert Park, United States . pp.9a.4, ⟨10.1109/ S3 S.2015.7333546⟩" .