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dcterms:bibliographicCitation
Melin T., Diesinger H., Deresmes D., Stiévenard D.. Electric force microscopy of individually charged semiconductor nanoparticles on conductive substrates : quantitative charge measurements and dipole-dipole interactions. 12th International Conference on Scanning Tunneling Microscopy, Spectroscopy and Related Techniques, STM'03, 2003, Eindhoven, Netherlands
dc:date
2003