Bibliographic Citation
| - Vigouroux Matthieu, Delaye V., Bernier N., Cipro R., Lafond D., Audoit G., Baron. T., Rouvière J.L., Martin M., Chenevier Bernard, Bertin F.. Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera. Applied Physics Letters, American Institute of Physics, 2014, 105 (19), pp.191906. ⟨10.1063/1.4901435⟩
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