About: François Bertin

Facets (new session)
Description
Metadata
Settings
- owl:sameAs
- Inference Rule:

About: François Bertin Goto Sponge NotDistinct Permalink

An Entity of Type : foaf:Person, within Data Space : data.idref.fr associated with source document(s)

Attributes	Values
type	Person
sameAs	Bertin, François (19..-.... ; auteur en instrumentation nucléaire)
Life Event	http://www.idref.fr/17056083X/birth
preferred label	Bertin, François (19..-.... ; auteur en instrumentation nucléaire)
name	François Bertin
dbpedia-owl:citizenship	http://sws.geonames.org/3017382/
Language	http://lexvo.org/id/iso639-3/fra
Given name	François
familyName	Bertin
note	Auteur d'une thèse de 3e cycle en instrumentation nucléaire (Grenoble, 1981). - Directeur de thèse à l'Université de Grenoble, 2012
gender	male
Scopus ID	7006292197
is sameAs of	Bertin, François (19..-.... ; auteur en instrumentation nucléaire)
is Thesis advisor of	http://www.sudoc.fr/178532614/id http://www.sudoc.fr/227416619/id http://www.sudoc.fr/007356781/id http://www.sudoc.fr/186085737/id http://www.sudoc.fr/170561275/id http://www.sudoc.fr/260650633/id Applications de la spectroscopie Raman et photoluminescence polarimétriques à la caractérisation des contraintes dans les structures semi-conductrices à base de silicium, germanium et d'arséniure de gallium http://www.sudoc.fr/230800513/id Instrumentation et traitement du signal pour la caractérisation thermique et mécanique d'un four de tirage Czochralski sous champ magnétique, application à la croissance de GaAs Applications métrologiques de l'ellipsométrie de Müller http://www.sudoc.fr/261924583/id http://www.sudoc.fr/237085380/id http://www.sudoc.fr/245466347/id
is Author of	Drying nano particles solution on an oscillating tip at an air liquid interface : what we can learn, what we can do Deterministic placement of doping atoms on hydroxylated surfaces 3D analysis of advanced nano-devices using electron and atom probe tomography Hydrogen passivation of silicium/silicium oxide interface by atomic layer deposited Hafnium Oxide and impact of silicon oxide underlayer Characterization of Integrated Nano Materials Influence of oxide density on O 2 diffusivity in thermally grown SiO 2 on Si and SiGe and on oxidation kinetics Crystal quality of SiGe films fabricated by the condensation technique and characterized by medium energy ion scattering Evaluation of ellipsometric porosimetry for in-line characterization of ultra low-$\kappa$ dielectrics Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera Oxidation kinetics of Si and SiGe by dry rapid thermal oxidation, in-situ steam generation oxidation and dry furnace oxidation Understanding and improving the low optical emission of InGaAs quantum wells grown on oxidized patterned (001) silicon substrate Spatially correlated structural and optical characterization of a single InGaAs quantum well fin selectively grown on Si by microscopy and cathodoluminescence techniques http://www.sudoc.fr/004894804/id Porosimetry measurements on low k dielectric constant thin layers by coupling spectroscopic ellipsometry and solvent adsorption-desorption https://hal.archives-ouvertes.fr/hal-01489332#id Study of the La-related dipole in TiN/LaOx/HfSiON/SiON/Si gate stacks using hard X-ray photoelectron spectroscopy and backside medium energy ion scattering https://hal.archives-ouvertes.fr/hal-01948091#id Confirmation of the Domino-Cascade Model by LiFePO(4)/FePO(4) Precession Electron Diffraction Femtosecond heterodyne pump probe platform Comparative Analysis of Growth Rate Enhancement and Ge Redistribution during Silicon-Germanium Oxidation by Rapid Thermal Oxidation Impact of high temperature annealing on La diffusion and flatband voltage (V-fb) modulation in TiN/LaOx/HfSiON/SiON/Si gate stacks Investigation of point defects in HfO 2 using positron annihilation spectroscopy: internal electric fields impact Functionalization of Silica Nanoparticles and Native Silicon Oxide with Tailored Boron-Molecular Precursors for Efficient and Predictive p -Doping of Silicon Monitoring of critical dimensions of bidimensional gratings by spectroscopic ellipsometry and Mueller matrix polarimetry Critical dimensions of biperiodic gratings determined by spectral ellipsometry and Mueller matrix polarimetry
is primary topic of	http://www.idref.fr/17056083X
is Opponent of	http://www.sudoc.fr/013483390/id http://www.sudoc.fr/245564012/id Contribution à la mise au point du procédé aérosol-gel, application au dépôt de couches minces optiques dans le système SiO2-TiO2 http://www.sudoc.fr/230605621/id
is Thesis referee of	http://www.sudoc.fr/200676091/id http://www.sudoc.fr/152831142/id http://www.sudoc.fr/199037140/id http://www.sudoc.fr/230897517/id http://www.sudoc.fr/198950810/id

Faceted Search & Find service v1.13.91 as of Aug 16 2018

Alternative Linked Data Documents: ODE Content Formats:

RDF

ODATA

Microdata

About

OpenLink Virtuoso version 07.20.3229 as of May 14 2019, on Linux (x86_64-pc-linux-gnu), Single-Server Edition (70 GB total memory)
Data on this page belongs to its respective rights holders.
Virtuoso Faceted Browser Copyright © 2009-2025 OpenLink Software