Bibliographic Citation
| - Vallero Alessandro, Savino Alessandro, Chatzidimitriou Athanasios, Kaliorakis Manolis, Kooli Maha, Riera Villanueva Marc, Di Natale Giorgio, Bosio Alberto, Canal Ramon, Gizopoulos Dimitris, Di Carlo Stefano. SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor Systems. IEEE Transactions on Computers, Institute of Electrical and Electronics Engineers, 2019, 68 (5), pp.765-783. ⟨10.1109/TC.2018.2887225⟩
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